| Temperature and frequency depended structural, morphological, and electrical topographies of Bi2MnFeO6 double perovskite |
| A. Tripathy, S. Bhuyan, S. N. Das, R. N. P. Choudhary |
| Department of Electronics and Communication Engineering , Siksha ‘O’ Anusandhan Deemed to be University , Bhubaneswar 751030 , India |
|
|
|
Received: July 20, 2022; Revised: October 10, 2022 Accepted: November 16, 2022. Published online: November 29, 2022. |
|
|
|
| ABSTRACT |
|
A double perovskite ceramic electronic sample of Bi2MnFeO6 has been formulated and synthesized using an ordinary solidstate sintering route from the metal oxides of bismuth, manganese, and iron. The crystallographic structure, morphological, dielectric, electrical, and current–voltage parameters have been analyzed for the fabricated sample. Room temperature XRD (X-ray diffraction) investigation confirms the monoclinic phase. The microstructure obtained from scanning electron microscope reveals compact grain structures with little or no voids. The impedance as well as its electrical properties have been appraised through the impedance analyzer (LCR meter) for a wide range of temperatures and frequencies (30–230 °C and 1 kHz–1 MHz). The negative temperature coefficient of the material is derived from the impedance analysis. The nonohmic behavior of the sample was confirmed by the current versus voltage (V–I) characteristic of the sample. Most of the significant physical and chemical properties linked with this compound may be critical in the development of future peer group electrical and electronic devices. |
| Key words:
Double perovskite · Conductivity · Dielectric · Electronic material |
|
|
|
PDF Links 
Full text via DOI
Download Citation 
