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A Study on the Electrical Properties of Al2O3/La2O3/Al2O3 Multi-Stacked Films Using Tunnel Oxide Annealed at Various Temperatures
Hyo-June Kim, Seung-Yong Cha, Doo-Jin Choi
J. Korean Ceram. Soc. 2009;46(4):436
DOI: https://doi.org/10.4191/kcers.2009.46.4.436
      
The Heat Treatment Effect of ZrO2 Buffer Layer on the Electrical Properties of Pt/SrBi2Ta2O9/ZrO2/Si Structure
정우석, 박철호, 손영국
J. Korean Ceram. Soc. 2003;40(1):52
DOI: https://doi.org/10.4191/kcers.2003.40.1.052
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