The Characterization of Electromagnetic Shielding of <TEX>$SiO_2$</TEX>/ITO Nano Films with Transition Metal Ions

,; ,; ,; ,; ,; ,; ,; ,

J. Korean Ceram. Soc. > Volume 38(1); 2001 > Article

Journal of the Korean Ceramic Society 2001;38(1): 15.

전이금속이 첨가된 $SiO_2$/ITO 나노박막의 전자파 차폐특성

신용욱, 김상우¹, 손용배¹, 윤기현

연세대학교 세라믹공학과
¹한국과학기술연구원 세라믹공정연구센타

The Characterization of Electromagnetic Shielding of $SiO_2$/ITO Nano Films with Transition Metal Ions

Key words: Transition metal, ITO, Electromagnetic shielding, Sheet resistance, TCO

TOOLS

PDF Links

Full text via DOI

Download Citation

METRICS

1,274

View

Download

Characterization of Tribological Properties of DLC Films Prepared by Different Deposition Method 2009 ;46(5)

Preparation and Electrical Properties of $YMnO_3$Thin Film by MOCVD Method 2001 ;38(5)

Preparation and Electrical Properties of $ErMnO_3$Thin Film Using Sol-Gel Process 2000 ;37(10)

Processing and Characterization of a Direct Bonded SOI using SiO$_2$ Thin Film 1999 ;36(8)

Synthesis and Characterization of Ultrafine $\beta$-SiC Powder by Vapor Phase Reaction 1998 ;35(11)

Editorial Office
Meorijae Bldg., Suite # 403, 76, Bangbae-ro, Seocho-gu, Seoul 06704, Korea
TEL: +82-2-584-0185 FAX: +82-2-586-4582 E-mail: ceramic@kcers.or.kr

About | Browse Articles | Current Issue | For Authors and Reviewers