Development of Novel Techniques for Determining the Oxygen Tracer Diffusion Coefficients in Oxides II - Measurements of the Depth Profiles of <TEX>$^{18}O$</TEX> Concentration in the solid Samples by Raman Spectroscopy

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J. Korean Ceram. Soc. > Volume 31(12); 1994 > Article

Journal of the Korean Ceramic Society 1994;31(12): 1459.

산화물에서의 산소추적자확산계수를 결정하는 새로운 방법의 개발 II - 라만분광법에 의한 고체시료 중의 시간에 따른 $^{18}O$ 농도변화 측정 -

김병국, 마하구찌히로오¹, 박순자²

서울대학교 무기재료공학과, 일본 카나가와과학기술아카데미
¹일본 카나가와과학기술아카데미
²서울대학교 무기재료공학과

Development of Novel Techniques for Determining the Oxygen Tracer Diffusion Coefficients in Oxides II - Measurements of the Depth Profiles of $^{18}O$ Concentration in the solid Samples by Raman Spectroscopy

ABSTRACT

A novel technique for determining the oxygen tracer diffusion coefficients in oxides was developed. After the 16O-18O solid-gas exchange reactions between 16O in the oxides and 18O in the ambient gas, Raman spectra of the cross sections of oxide samples were measured in a spatial resolution of 5 ${mu}{textrm}{m}$. From thus obtained Raman spectra, depth profiles of 18O concentration in the oxide samples were calculated. The oxygen tracer diffusion coefficients and the surface exchange coefficients were determined under the assumptions that samples are semi-infinite slab and that the surface exchange reactionsare not negligible. The oxygen tracer diffusion coefficient of 2.8 mol% Y2O3-containing tetragonal ZrO2 polycrystals, 8 mol% Y2O3-containing ZrO2 polycrystals, and 10 mol% Y2O3-containing cubic ZrO2 single crystals (along the a axis) are as follows.