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Effect of Working Pressure and Substrate Bias on Phase Formation and Microstructure of Cr-Al-N Coatings
Seon-A Choi, Seong-Won Kim, Sung-Min Lee, Hyung-Tae Kim, Yoon-Suk Oh
J. Korean Ceram. Soc.. 2017;54(6):511-517.   Published online 2017 November 29    DOI: https://doi.org/10.4191/kcers.2017.54.6.05

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Effect of Working Pressure and Substrate Bias on Phase Formation and Microstructure of Cr-Al-N Coatings
Journal of the Korean Ceramic Society. 2017;54(6):511-517   Crossref logo
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Influence of substrate bias on the microstructure of sputtered Al-Zn alloy coatings
Surface and Coatings Technology. 1994;68-69:332-338   Crossref logo
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[P101] Effect of temperature gradient on microstructure evolution in Ni-Al-Cr substrate/bond coat systems: a phase-field study
Calphad. 2015;51:405   Crossref logo
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Microstructure, phase composition and mechanical properties of plasma sprayed Al 2 O 3 , Cr 2 O 3 and Cr 2 O 3 -Al 2 O 3 composite coatings
Surface and Coatings Technology. 2017;316:138-145   Crossref logo
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Effect of nitrogen pressure, bias voltage and substrate temperature on the phase structure of Mo–N coatings produced by cathodic arc PVD
Surface and Coatings Technology. 2003;167(1):77-82   Crossref logo
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The Effect of Si Content and Substrate Bias on Structural and Tribological Properties of (Cr,Si)N Coatings under Water Lubrication
Tribology and Interface Engineering Series. 2005;401-407   Crossref logo
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Phase formation at the interface between a boron alloyed steel substrate and an Al-rich coating
Surface and Coatings Technology. 2013;226:130-139   Crossref logo
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Microstructure and resistance to cracking of modified Al-Si and Al-Cr diffusion coatings on ZS6K nickel-based superalloys
Surface and Coatings Technology. 1992;54-55:84-90   Crossref logo
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Microstructure and hardness of reactively r.f. magnetron sputtered Cr-V-O thin films in dependence on composition and substrate bias
Surface and Coatings Technology. 2014;257:355-362   Crossref logo
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Relationship between substrate bias and microstructure in magnetron-sputtered AlCu films
Vacuum. 1989;39(5):494   Crossref logo
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