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(K,Na)NbO3-based Lead-free Piezoelectric Materials: An Encounter with Scanning Probe Microscopy
Mao-Hua Zhang, Hao Cheng Thong, Yi Xue Lu, Wei Sun, Jing-Feng Li, Ke Wang
J. Korean Ceram. Soc.. 2017;54(4):261-271.   Published online 2017 July 27    DOI: https://doi.org/10.4191/kcers.2017.54.4.10

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(K,Na)NbO3-based Lead-free Piezoelectric Materials: An Encounter with Scanning Probe Microscopy
Journal of the Korean Ceramic Society. 2017;54(4):261-271   Crossref logo
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Hierarchy and scaling behaviour of multi-rank domain patterns in ferroelectric K0.9Na0.1NbO3 strained films
Nanotechnology. 2017;   Crossref logo
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Scanning Probe Microscopy: Electrical Scanning Probe Microscopy on Active Organic Electronic Devices (Adv. Mater. 1/2009)
Advanced Materials. 2009;21(1):NA-NA   Crossref logo
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Effects of LiF on the Structure and Electrical Properties of (Na<sub>0.52</sub>K<sub>0.435</sub>Li<sub>0.045</sub>)Nb<sub>0.87</sub>Sb<sub>0.08</sub>Ta<sub>0.05</sub>O<sub>3</sub> Lead-Free Piezoelectric Ceramics Sintered at Low Temperatures
Journal of Materials Science and Chemical Engineering. 2015;03(11):13-20   Crossref logo
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Bi-Based Lead-Free Piezoelectric Ceramics
Advanced Piezoelectric Materials. 2017;155-196   Crossref logo
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Lead-free (K 0.5 Na 0.5 )NbO 3 thin films by pulsed laser deposition driving MEMS-based piezoelectric cantilevers
Materials Letters. 2016;164:413-416   Crossref logo
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Scanning probe microscopy
Materials Today. 2006;9(6):53   Crossref logo
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Influence of Sintering Temperature on Densification, Structure and Microstructure of Li and Sb Co-Modified (K,Na)NbO<sub>3</sub>-Based Ceramics
Materials Sciences and Applications. 2011;02(10):1416-1420   Crossref logo
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Piezoelectric Thermal Stability of (K x Na 1-x )NbO 3 Based Ceramics
Rare Metal Materials and Engineering. 2016;45(11):2763-2767   Crossref logo
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Scanning Probe Microscopy: The Lab on a Tip
Materials Today. 2003;6(12):59   Crossref logo
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