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Phase Formation and Oxygen Ion Conduction of $La(Ba)Ga(Mg)O_3_delta$ Perovskite Oxide System
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J. Korean Ceram. Soc.. 1999;36(10):1056

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Ferrimagnetic Sr$_{1.5}$Ba $_{0.5}$Zn$_2$Fe $_{12}$ O$_{22}$ (Zn-Y) Single Crystal With Planar Anisotropy
IEEE Magnetics Letters. 2011;2:5000104-5000104   Crossref logo

An Ultra-Low-Power MMIC Amplifier Using 50-nm $\delta$ -Doped $\hbox{In}_{0.52}\hbox{Al}_{0.48}\hbox{As/In}_{0.53} \hbox{Ga}_{0.47}\hbox{As}$ Metamorphic HEMT
IEEE Electron Device Letters. 2010;31(11):1230-1232   Crossref logo

Electronic Phase Separation in Multiferroic ${\rm Ba}_{3}{\rm NbFe}_{3}{\rm Si}_{2}{\rm O}_{14}$
IEEE Transactions on Magnetics. 2012;48(11):3529-3531   Crossref logo

Irrecoverable and Recoverable Resistivity Resulting From the First Order Magnetic-Structural Phase Transition in Gd $_5$(Si $_x$Ge$_{1-x}$)$_4$
IEEE Magnetics Letters. 2010;1:6000104-6000104   Crossref logo

YBa $_2$ Cu $_3$ O $_{7-\delta }$ -CeO $_2$ -YBa $_2$ Cu $_3$ O $_{7-\delta }$ Multilayers Grown by Reactive Co-Evaporation on Sapphire Wafers
IEEE Transactions on Applied Superconductivity. 2019;29(5):1-4   Crossref logo
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Optimal $ \Sigma \Delta$ Modulator Architectures for Fractional-$ {N}$ Frequency Synthesis
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 2010;18(2):194-200   Crossref logo

Reliability and Joint Reliability Importance in a Consecutive- $k$ -Within- $m$ -out-of- $n$ :F System With Markov-Dependent Components
IEEE Transactions on Reliability. 2016;65(2):802-815   Crossref logo

Degradation Analysis of $k$ -out-of- $n$ Pairs:G Balanced System With Spatially Distributed Units
IEEE Transactions on Reliability. 2016;65(2):941-956   Crossref logo

Clusters of Long- $c$ Lattice Phase in ${\rm SmBa}_{2}{\rm Cu}_{3}{\rm O}_{y}$ Films Grown in Low-$P_{{\rm O}2}$ Atmosphere by Pulse Laser Deposition
IEEE Transactions on Applied Superconductivity. 2009;19(3):3383-3386   Crossref logo

A Low-Power, $W$-Band Phase Shifter in a 0.12 $\mu{\rm m}$ SiGe BiCMOS Process
IEEE Microwave and Wireless Components Letters. 2010;20(11):631-633   Crossref logo

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