Characterizing electrical breakdowns upon reoxidation atmosphere for reliable multilayer ceramic capacitors
Daehee Lee, Kwanwoo Song, Dongjun Jung, Bermha Cha, Myungjun Park, Jonghan Kim, Jong Ho Lee
J. Korean Ceram. Soc. 2021;58(4):445-451.   Published online 2021 Jul 31     DOI: https://doi.org/10.1007/s43207-021-00121-9
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