Residual Stress and Elastic Modulus of Y2O3 Coating Deposited by EB-PVD and its Effects on Surface Crack Formation
Dae-Min Kim, Yoon-Soo Han, Seongwon Kim, Yoon-Suk Oh, Dae-Soon Lim, Hyung-Tae Kim, Sung-Min Lee
J. Korean Ceram. Soc. 2015;52(6):410 DOI: https://doi.org/10.4191/kcers.2015.52.6.410
Citations to this article as recorded by 
Effects of HfO2 addition on the plasma resistance of Y2O3 thin films deposited by e-beam PVD
Kang-Bin Bae, Hae-Seong Jang, Yoon-Suk Oh, In-Hwan Lee, Sung-Min Lee
Applied Surface Science.2023; 640: 158359. CrossRef
Residual stress measurements in electron beam evaporated yttria doped zirconia films deposited on Si (111) substrates
Kamalan Kirubaharan Amirtharaj Moses, Kuppusami Parasuraman, Sujay Chakravarty, Arul Maximus Rabel, Anandh Jesuraj Selvaraj, Akash Singh
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films.2018;[Epub] CrossRef
Thermal expansion studies of electron beam evaporated yttria films on Inconel-718 substrates
Kamalan Kirubaharan A.M., Kuppusami P., Dharini T.
Surface and Coatings Technology.2018; 354: 297. CrossRef