Microstructure and Ferroelectric Properties of PZT Thin Films Deposited on various Interlayers by R.F. Magnetron Sputtering
Chul-Ho Park, Duck-Young Choi, Young-Guk Son
J. Korean Ceram. Soc. 2002;39(8):742     DOI: https://doi.org/10.4191/kcers.2002.39.8.742
Citations to this article as recorded by Crossref logo
Electrochemical Characteristics of Silicon-Doped Tin Oxide Thin Films for Application of Lithium Secondary Micro-Battery Anode
Chul Ho Park, Young Gook Son, Tae-Ho Ko
Materials Science Forum.2005; 486-487: 1.     CrossRef
Electrical Properties of Ba0.66Sr0.34TiO3Thin Films Fabricated by a Seed-layer Process
Journal of the Korean Ceramic Society.2003; 40(2): 198.     CrossRef