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Effect of WSi$_2$ Gate Electrode on Thin Oxide Properties in MOS Device
박진성, 이현우, 김갑식, 문종하, 이은구
J. Korean Ceram. Soc. 1998;35(3):259
      
The Effect of the Microdefects in Czoscralski Si wafer on Thin Oxide Failures
박진성, 이우선, 김갑식, 문종하, 이은구
J. Korean Ceram. Soc. 1997;34(7):699
      
Characteristics of Oxynitride Dielectics Prepared in $N_2O$ Ambient by Furnace
이은구, 박인길, 박진성
J. Korean Ceram. Soc. 1995;32(1):31
      
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