Compouter Image Simulation of <TEX>${gamma}$</TEX>-Al2O3 in High-Resolution Transimission Electron Microscopy

,; ,; ,; ,

J. Korean Ceram. Soc. > Volume 26(2); 1989 > Article

Journal of the Korean Ceramic Society 1989;26(2): 276.

고분해능 투과전자현미경 연구에 의한 ${gamma}$-Al2O3의 상 전산모사

이정용, R. Gronsky¹

한국과학기술대학, 전자재료과

Compouter Image Simulation of ${gamma}$-Al2O3 in High-Resolution Transimission Electron Microscopy

¹University of California, Berkeley

ABSTRACT

Interpretation of high-resolution transmission electron microscopy images of defects and complex structures such as found in ceramics generally requires matching of the images with compound image simulations for reliable interpretation. A transmission electron microscopy study of the aluminum oxide was carried out at high-resolution, so that the crystal structure of the aluminum oxide could be modelled on an atomic level. In conjunction with computer simulation comparisons, the images reveal directly the atomic structure of the oxide. Results show that comparison between experimental high-resolution electron microscopy images and simulated images leads to a one to one correspondence of the image to the atomic model of the aluminum oxide. The aluminum atoms are disordered in the octahedral sites and the tetrahedral sites in the spinel aluminum oxide.